Probe station

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Die probe station

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Probe station Die probe station AOI testing equipment Exposure machine Sorter

Comprehensive high-precision semi-automatic probe station

Comprehensive high-precision semi-automatic probe station

Suitable for semi-automatic probe testing of 4-8 inch discrete devices, integrated circuits, RF devices, optical chips and other wafers.

Comprehensive high-precision semi-automatic probe station

Suitable for semi-automatic probe testing of 4-8 inch discrete devices, integrated circuits, RF devices, optical chips and other wafers.

Next Generation 12" Full-Auto Prober

Next Generation 12" Full-Auto Prober

The first 12-inch wafer probe equipment manufacturer in mainland China to realize industrial application

Next Generation 12" Full-Auto Prober

It is suitable for automatic probe testing of 8 to 12 inch integrated circuit wafers.Based on the modular platform design, the module can be customized according to the product requirements, equipped with a fully automatic loading and unloading system, with the characteristics of high speed, high precision and high rigidity; suitable for wafer level testing in LCD Driver, SOC, Memory, CIS, advanced packaging and other fields.

Next Generation 12" Full-Auto Prober

Next Generation 12" Full-Auto Prober

It integrates high precision, high efficiency, low vibration and low noise, and effectively improves efficiency by 50% and accuracy by 30%.

Next Generation 12" Full-Auto Prober

It is suitable for automatic probe testing of 8 ~ 12 inch integrated circuit wafers.Compatible with wafer and Frame iron ring transmission test, equipped with automatic loading and unloading system, integrated linear motor motion platform, with high precision, high rigidity, high efficiency and high stability.Convenient switching between wafer test and Frame hoop test.

12 Inch automatic probe station

12 Inch automatic probe station

The first 12-inch wafer probe station equipment manufacturer in mainland China to achieve industrial application

12 Inch automatic probe station

A probe station with high precision, high rigidity, and high efficiency applied to industrialization at home

8 Inch Automatic Probe Station

8 Inch Automatic Probe Station

Suitable for wafer testing of integrated circuits and power devices of 8 inches and below

8 Inch Automatic Probe Station

Suitable for automatic probe testing of 5~8 inch integrated circuit wafers. The whole machine is specially designed for the test needs of integrated circuit multi-core and multi-probe and high positioning accuracy, which can meet the single-core or multi-core test of less than 2000 probes, and is equipped with a fully automatic loading and unloading system, which has the characteristics of high precision, high rigidity and high stability; Automatic needle alignment improves the alignment accurac

8 inch automatic probe station

8 inch automatic probe station

Suitable for wafer testing of integrated circuits and power devices of 8 inches and below

8 inch automatic probe station

Suitable for automatic probe testing of 5~8 inch integrated circuit wafers. The whole machine is specially designed for the test needs of integrated circuit multi-core and multi-probe and high positioning accuracy, which can meet the single-core or multi-core test of less than 1000 probes, and is equipped with a fully automatic loading and unloading system, which has the characteristics of high precision, high rigidity and high stability. Automatic needle alignment improves the alignment accurac

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