Probe station Die probe station AOI testing equipment Exposure machine Sorter
Formal wafer sampling system
L-915
Formal wafer sampling system
It can be applied to the photoelectric test of LED WAT formal assembly test in batches
L-915
Formal wafer sampling system
Compatible with COW and WAT processes, it can meet the automatic sampling test of 4~6-inch full-size LED uncut wafer
Flip LED test system
L-20DM
Flip LED test system
A multi-channel probe card test all-in-one machine applied to full test of chiplet-level LED flipped chips
L-20DM
Flip LED test system
A multi-channel probe card test all-in-one machine applied to full test of chiplet-level LED flipped chips
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