Probe station

Company Profile

Development History

Die probe station

AOI testing equipment

Exposure machine

Automated Testing

Semiconductor Test

Service Support

Quality Control

Enterprise dynamics

Probe station Die probe station AOI testing equipment Exposure machine Sorter

6 inch Semi-Automatic Probe Station

6 inch Semi-Automatic Probe Station

Suitable for wafer testing of integrated circuits and power devices of 6 inches and below

6 inch Semi-Automatic Probe Station

Suitable for automatic testing of 4, 5 and 6-inch integrated circuits and discrete devices, equipped with CCD vision system, automatic scanning and positioning operation, and truly "one-click testing"

8 inch semi-automatic probe station

8 inch semi-automatic probe station

Suitable for wafer testing of integrated circuits and power devices of 8 inches and below

8 inch semi-automatic probe station

Suitable for automatic testing of 4~8 inch integrated circuits and discrete device wafers. This machine has a variety of flexible testing methods and rich MAPPING processing functions. The product design meets the needs of multi-core and long-needle card testing, and can be equipped with a vision system to achieve automatic scanning and positioning according to the test requirements, and can also be equipped with high temperature and high pressure testing

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